Leading the imaging system development of the flagship wafer inspection tool
Skills: MATLAB; Python; JMP; Prolith; Optical modeling; Optical metrology; Testing to verify imaging component; Characterization of system level performance; Mechanical tolerance analysis
Innovated an optical imaging model that is adopted for developing all flagship features, achieving <1% prediction error in new features development. Presented it to a division-wide audience of 100+ professionals.
Defined 100+ requirements, including mechanical range and tolerance for optics.
Improved optical metrology accuracy by 3x to advance the next-generation products.
Led cross-functional teams across optical, optomechanical, electrical, software engineering and manufacturing to integrate new optics into next-generation products.
Led the development of an optical sensor that is adopted across all current and the next-generation products.
Developed metrology that is widely adopted by the stage team for assessing a new mechanical stage subsystem.
Led root-cause, failure and corrective-action analysis, resolving a critical customer escalation in two weeks.